Helios 6 HD & AutoTEM 6: High-Throughput TEM Sample Prep with AI-Powered Automation

Описание: Streamline your FIB-SEM lab workflow with the Helios 6 HD DualBeam and AutoTEM 6 Software. This tutorial showcases how you can prepare consistent, high-quality TEM samples across multiple systems and sites—faster and with fewer manual steps.

Explore the power of AI-enhanced automation with features like Line Indicated Termination (LIT) for precise lamella targeting, improved thickness repeatability (up to 35%), and machine learning-powered SEM endpointing. With AutoTEM 6, you can focus on breakthrough research while the system handles repetitive tasks.

🔗 Learn more: https://www.thermofisher.com/us/en/ho...

Keywords & Topics:
• Helios 6 HD
• AutoTEM 6 Software
• FIB-SEM Automation
• TEM Sample Preparation
• Line Indicated Termination (LIT)
• SEM Endpointing
• Lamella Thickness Repeatability
• AI in Sample Prep
• Multi-Site Productivity
• Semiconductor Sample Challenges

#Helios6 #AutoTEM6 #TEMSamplePrep #ElectronMicroscopy #FIBSEM #ThermoFisher #Automation #Semiconductors #AIinMicroscopy #LamellaPreparation #LIT #MachineLearning #TEMAutomation

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