3D Optical Profilometer | Contour Elite Automation Applications | Bruker
Автор: Bruker Nano Surfaces & Metrology
Загружено: 2017-05-16
Просмотров: 616
Описание:
The fully automated, large-sample Contour Elite X 3D Optical Profiler combines unmatched measurement capabilities with highest vertical resolution over the industry’s largest field of view and high-fidelity color or monochrome imaging. No other metrology system provides the non-contact accuracy, throughput, operator convenience, and imaging capabilities to address such a vast range of production metrology applications.
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🔬Production-ready metrology and high-fidelity imaging for industrial applications:
https://www.bruker.com/en/products-an...
🔥Advanced WLI profilers provide robust metrology-based inspection for advanced packaging applications:
https://www.bruker.com/en/products-an...
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