3D Optical Profilometer | Advancements: From Wyko NT to Contour Elite | Bruker
Автор: Bruker Nano Surfaces & Metrology
Загружено: 2017-07-17
Просмотров: 2590
Описание:
Please join us to discuss the technological advances in the Bruker Contour Optical Profiler product line over past optical profilers. These profilers allow fast and very accurate surface topography measurements over large areas. The improvements in hardware and software will also be presented, along with advancements in additional measurement modes and hardware options. Some of these software improvements include measurement of thin films, versatile and powerful automation, and combined measurement modes for large Z measurement heights with angstrom resolution.
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🔥Production-ready metrology and high-fidelity imaging for industrial applications
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