nanoHUB-U Fundamentals of AFM L4.4: Force Spectroscopy - Processing Force Curves

Описание: Table of Contents:
00:09 Lecture 4.4: Processing Force Curves
01:19 The Basic Force vs. z-Displacement Experiment
03:55 I. Infinitely hard materials, no surface forces
11:24 II. Infinitely hard sample/tip, repulsive surface force
15:28 III. Soft material, no surface forces
19:41 Calibration on hard sample
21:29 infinitely hard sample
22:33 Errors Can Be Large When Measuring Deformation
23:12 Force spectroscopy -- an example
24:15 Artifacts when measuring cantilever deflection vs. z-displacement
25:37 Artifacts when measuring cantilever deflection vs. z-displacement
26:35 Artifacts
27:08 Simulations: Force-Distance Outputs in VEDA
27:47 Up Next: Modulus and Adhesion Maps


This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 1 Fundamental Aspects of AFM. (https://nanohub.org/courses/AFM1)

Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.

The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.

Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.