nanoHUB-U Fundamentals of AFM L4.5: Force Spectroscopy - Modulus and Adhesion Maps

Описание: Table of Contents:
00:09 Lecture 4.5: Modulus and Adhesion Maps
00:44 AFM enables a new class of experiments
02:33 Force vs. Displacement experiment
03:58 A. Force vs. Time
04:59 The Idea: Modulus and Adhesion Maps
07:00 Write software that automatically measures quantities of interest
08:25 Simple Test (circa 1998): Au Bridge Connected to Contact Pads
10:49 State of the art (circa 2010): Cellulose NanoCrystal (CNC) on mica
12:09 State of the art (circa 2011): Steps along the way
13:31 State of the art (circa 2011): Typical Data
15:15 State of the art (circa 2011): Modulus and Adhesion Maps
17:28 Up Next: Lateral Force Microscopy

This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 1 Fundamental Aspects of AFM. (https://nanohub.org/courses/AFM1)

Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.

The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.

Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.