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Penning Trap and Ion Gun: Electromagnetic Analysis of Particle Trajectory Applications
Автор: INTEGRATED Engineering Software
Загружено: 2011-11-23
Просмотров: 3611
Описание:
http://www.integratedsoft.com/Applica...
Many devices are affected by the motion of charged particles in electric and/or magnetic fields. Applications utilizing electron or ion beams or traps deliberately make use of this motion. The device performance may ultimately be limited by the ability to obtain the desired field strengths or spatial distributions.INTEGRATED's charged particle trajectory simulation module, LORENTZ , provides scientists and engineers with a powerful tool to address these issues.
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