PLus-Spot: Fast, non-contact, photoluminescence defect imaging

Описание: The Plus-Spot system enables the imaging of defects and nor-uniformities in solar panels (particularly processed or finished) in a fast, non-contact mode. No need to connect and disconnect cables for testing, and no operator is needed.

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BIPV and VIPV Applications
For Building-Integrated and Vehicle-Integrated PV and other application that involve buying panels and integrating them into structures
• Test purchased panels to see cracked cells prior to integration
• Test after integration
BIPV and VIPV Applications
For Building-Integrated and Vehicle-Integrated PV and other application that involve buying panels and integrating them into structures
• Test purchased panels to see cracked cells prior to integration
• Test after integration
Satellite PV Applications
• Test purchased panels prior to integration for cell/CIC cracks
• Test panels midway during production
• Test panels after mounting when contacting strings for EL is difficult or not possible
Monochromatic Light IV Testing
• Perform an IV sweep using monochromatic LED illumination by connecting to the leads of the panels
• Correlate the results to Pmax testing using a true solar simulator
• Use for incoming quality control of purchased panels
• Use as production quality control
• Can perform Electroluminescence (EL) imaging at the same time
The Plus-Spot includes:
• Industrial camera(s), lens(es), and filters customized for each use case (semiconductor band gap, test area, desired resolution)
• Array of fan-cooled LEDs (blue or green)
• Programmable power supplies) to drive LEDs
• Enclosure to support LEDs, to improve light intensity and uniformity, and to eliminate room light artifacts
• Customized metal frame to support the structure over/under a factory transport system or over a table
• Electronics housing for LED power supplies, E-Stop, and PLC interface
• IMPEL software on a Windows Computer
• No-charge software upgrades and usage assistance for two years
• Optional cables and programmable power supply for EL testing and dark IV testing
• Optional load for monochromatic or biochromatic light IV testing and/or biased PL testing
• Optional IMPEL controllable filter wheel for multispectral imaging
• Optional LEDs to see rear side glass cracks in superstrate thin-film panels (front side cracks seen in PL image already)
• Optional spectrometer for spot spectral PL or EL measurements
• Optional conveyor for panel transport
• Optional RGB camera for visible light imaging at the infeed or outfeed station

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