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Electronics and PCB Failure Analysis | FT-IR Microscopy | LUMOS II | IEC 61191
Автор: Bruker
Загружено: 2025-08-27
Просмотров: 595
Описание:
A PCB that is dead on arrival is examined by FTIR microscopy. A large crystalline contamination is found and chemically analyzed. Check description for whole webinar!
Our application specialist navigates you from sample inspection to the result and uses the FTIR microscope LUMOS II.
Learn more about OPUS A.I.D. for microscopy:
• A.I.D. for Microscopy | IR & Raman Microsc...
Our failure analysis webinar can be found here:
https://www.bruker.com/events/webinar...
More about failure analysis with FTIR:
https://www.failure-analysis-ftir.com/
More on the LUMOS II:
https://www.bruker.com/lumos
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