Basics and applications of good SAXS: Quantifying the fine structure of lots of materials - lecture

Описание: Online lecture for the OptecBB "Webinar within the scope of the focus area Optical Analytics", held on the 27th of May, 2020. Here, I briefly introduce the technique and highlight some recent applications.
[Editor's note: the two-tone beeps throughout the lecture are due to the Cisco WebEx platform putting the audience sign-on and sign-off sounds in the recording per default. Also, a recording error led to the file being split over two computers, hence the transition at the beginning.]

Abstract: "In contrast to the crisp, clear images you can get from electron microscopy, small-angle X-ray scattering (SAXS) patterns are rather featureless. These patterns, however, contain averaged structural information of all of the finest material structures that were illuminated by the X-ray beam. With careful and precise investigation, and supplementary information from complementary techniques, this bulk material structure can be quantified to reveal structural information spanning four or even five decades in size. Additionally, while the data correction and analysis is complex, sample preparation is very straightforward, also allowing for in-situ and operando measurements to be performed without breaking a sweat. In the right hands, then, this technique can be the most powerful tool in your analytical arsenal."