ATE J750 system Channel Card relays testing

Описание: ATE system card repair service:

Relays are tested in-circuit.
Accurately test relay functions;
1 Contact resistance in mOhm
2 Switching times (On/Off) in mSec or uSec.
3. Bounce during turn on or turn off.

THis is a relay card used in an ATE system, card has relays on both sides of board. Our system tests this card (both sides) in less then 7 minutes. Test time for each side is 2.59 minutes.

This test program is generated in less then 20 minutes with our in-house developed 'image-drive' Programing Tool.

Image-Driven programming method is easy to use, any user can pickup our 'TIU Off-line Troubleshoot System' programming in less then an hour.
User does not need to have any;
Software knowledge.
Hardware knowledge.
Device knowledge.
ATE system h/w, s/w and app knowledge.

For more information:
1) Off-Line TIU (Tester Interface Unit) troubleshoot system,
2) Relay's reliability and it impact in Semiconductor test operation.
3) Our success stories on how our system or service restore DIB or TIU performance.

Please do one or all the following;
1) email to [email protected]
2) Subscribe to this channel.
3) Youtube search for key words (DIB, ATE, Relay, Testing)