【HGTECH】🔍 Aeye1406: Leave No Defect Unnoticed
Автор: HGTECH
Загружено: 2025-05-09
Просмотров: 95
Описание:
Powered by a 4-in-1 optical inspection system and 4-channel simultaneous detection, Aeye1406 enables fast, precise SiC substrate defect classification with 45% more computing power.
#SiC #DefectDetection #SemiconductorInspection
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Contact info:
Email: [email protected]
Tel: +86-27-87180225
https://www.hglaserglobal.com/
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