Thin Films XRD Highpix 2D Detectors & SmartLabs

Описание: https://rigaku.com/
We explore the characterization of functional thin films using Highpix 2D Detectors and SmartLabs for XRD measurements. Our focus is on phase identification and crystal analysis for improved device performance, including GI wax measurements and in-plane direction profiling.
[02:58-03:24]
Characterization of functional thin films is necessary not only for phase identification of composing materials, but also for further characterization of constituent crystals since these physical parameters are closely correlated with device performance. Highpix Series 2D Detectors enable various kinds of XRD measurements that have previously only been performed at synchrotron facilities.
[03:24-03:41]
SmartLabs now support GI wax measurements with a new optical system and 2D detector. It is possible to capture the in-plane direction profile clearly and independent of sample shape. The optics are easy to set up using the guidance function.