High Accuracy Optical Metrology for MicroLED Displays and Wafers
Автор: Instrument Systems GmbH
Загружено: 2025-10-13
Просмотров: 189
Описание:
From wafer to display: How optical metrology improves the efficiency of MicroLED manufacturing
Dr. Tobias Steinel (MicroLED Connect 2025) presents traceable testing methods using electroluminescence (EL) and photoluminescence (PL). Discover how imaging systems from Instrument Systems deliver fast, reliable results — from single MicroLEDs to full wafers.
▸ Traceable MicroLED testing with optical metrology
▸ Electroluminescence and photoluminescence measurement methods
▸ High-speed imaging for wafer and display inspection
Learn more at:
https://www.instrumentsystems.com/en/...
#MicroLED #WaferTesting #OpticalMetrology #DisplayTesting #InstrumentSystems
Повторяем попытку...
Доступные форматы для скачивания:
Скачать видео
-
Информация по загрузке:
