Jenoptik Waveline Evovis 2.0 (Profile operations) – Industrial Metrology
Автор: Jenoptik
Загружено: 2015-12-08
Просмотров: 1981
Описание:
The Waveline Evovis 2.0 software is easy to use and offers a standardized interface for roughness and contour measurement. It is specifically designed for operation with our mobile measurement devices and has extensive assistance for the configuration of individual measurement applications.
Our Waveline Evovis 2.0 software is characterized by a clear and concise structure with a remote operation of the Waveline W5 and W10. The mobile roughness measuring devices become a stationary measuring station in online mode, where the measuring device is directly controlled by the Evovis 2.0 software. In offline mode, the parameters and profile data collected locally and stored in the measuring device are centrally evaluated by the software.
For more information please visit:
https://www.jenoptik.com/products/met...
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