Surface Measurement | Precision Metrology for Enhanced Solar Efficiency | Bruker
Автор: Bruker Nano Surfaces & Metrology
Загружено: 2011-07-20
Просмотров: 857
Описание:
In this recording of the July, 2011, Optical Microscopy and Stylus Profilometry Webinar Series, Bruker presented an overview of the various aspects of the current solar industry. Following the brief overview, an examination of the use of metrology in the solar industry and why it is needed was covered.
Using the DektakXT stylus profiler and the ContourGT family of 3D optical microscopes, the benefits of both optical and stylus metrology to increase solar efficiency were presented with clear imagery and data.
The webinar concluded with a summary and a live Q&A session.
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