s-SNOM and nano-FTIR intro and overrview

Описание: Rainer Hillenbrand speaks about the technical aspects of SNOM, its practical applications, and the theoretical models that support data interpretation in microscopic studies. These topics highlight the detailed mechanisms of SNOM, showcasing its utility in exploring material properties at the nanoscale through both practical demonstrations and theoretical insights.

1. Understanding the Fundamentals and Mechanics of SNOM:
The discussion provides a comprehensive understanding of SNOM, including its basic probing mechanisms using metal tips and the role of background suppression techniques such as higher harmonics demodulation. This foundational knowledge is crucial for anyone looking to apply or understand SNOM in practical settings.

2. Advanced Detection Techniques in SNOM:
The lecture covers the distinctions and benefits of intensity versus interferometric detection within SNOM. This includes an exploration of how interferometric detection can provide amplitude and phase images or spectra, offering deeper insights into the material properties at the nanoscale.

3. Theoretical Modeling and Practical Applications:
The session introduces the point dipole model, which helps in understanding how SNOM interactions occur at a microscopic level, including the interaction of light with the tip and sample. This model aids in the interpretation of SNOM data and enhances the understanding of near-field and far-field effects in optical microscopy.

This video was recorded with the financial support of the Teaming for Excellence program (European Union Horizon 2020; GA 857543) during the Near-field Optical Nanoscopy Summer School (Donostia- San Sebastian; 6-9 June 2023) organized by neaspec/attocube AG, CIC nanoGUNE BRTA and the ENSEMBLE3 Centre of Excellence.