PrimeNano Tool Talk: Advances in Scanning Microwave Impedance Microscopy

Описание: Scanning Microwave Impedance Microscopy (sMIM) is a near-field scanning probe microscopy technique where a customized microwave AFM cantilever probe is used to measure the electrical properties of materials at the nanoscale. Microwave signals are sent through an AFM cantilever and the reflected signal is collected. The reflected microwave signal is a measure of the impedance of the sample underneath the AFM tip.

sMIM provides images of the variations in local capacitance and conductance with nanoscale resolution, making it an excellent method for characterizing a wide range of materials such as semiconductors, insulators, 1D/2D, ferroelectric materials, and more. A great deal of cutting-edge physical investigations concerning fundamental mechanisms frequently involve electrical measurements at low temperature and high magnetic fields. LT, mK, and UHV ScanWave™ systems are low temperature sMIM turnkey solutions for frontier research in physics (quantum effects, phase transitions, etc.) and novel material studies (topological insulators, ferroelectrics, manganates, etc.), enabling electrical characterization of materials at ultra-low temperatures and high magnetic fields.

In this talk, PrimeNano will present ScanWave™ technology and review the state of the art in sMIM applications and case studies at room temperature and cryogenic temperatures, showing the versatile applicability of sMIM.

MIT.nano tool talks are designed to introduce the latest transformative technologies, tools, methods, and even new sciences. These technical talks are sponsored by individual tool suppliers and geared toward the entire MIT community. The talks are scheduled approximately once a month and are organized by Characterization.nano.

mitnano.mit.edu/events/tool-talks