Automatic 32-Sample XRF Scanning System for High Throughput Composition Analysis - EQ-XRF-32
Автор: MTI Corp
Загружено: 2017-05-03
Просмотров: 140
Описание:
EQ-XRF-32 is a high throughput, automatic 32-sample X-ray fluorescence (XRF) / energy dispersive spectrometer (EDS) system for non-destructive composition analysis. The station integrates a handheld XRF spectrometer with XY stage, 32-sample station and laptop remote control. It enables quick and easy composition analysis of samples (elements from Mg to Bi), with concentration as low as 0.01%. The system automation provides 32-sample testing, analysis, result output in one autorun with the push of a single button. It is an excellent tool for high throughput research and development of powder and bulk materials, for applications such as high-entropy alloys, novel magnetic materials, solid ceramic electrolyte materials, etc
http://www.mtixtl.com/EQ-XRF-32.aspx
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