Скачать
Advanced 3D Optical Profilometer | Accelerating Semiconductor Process Control | Bruker
Автор: Bruker Nano Surfaces & Metrology
Загружено: 2019-12-17
Просмотров: 2173
Описание:
Webinar originally aired in December 17, 2019. Featured Speaker: Samuel Lesko, Ph.D.
In this webinar, we present case studies that address improving yield, identifying root cause failure and driving next generation device development from bare wafer to final packaged device.
FULL ABSTRACT: https://www.bruker.com/en/news-and-ev...
--
🔬Worldwide leader in 3D surface measurement and inspection:
https://www.bruker.com/en/products-an...
📲Stay connected with us!
Twitter: / brukernano
LinkedIn: / bruker-nano-inc-
#Bruker #3Dsurfaceprofiler #Webinar
Не удается загрузить Youtube-плеер. Проверьте блокировку Youtube в вашей сети.
Повторяем попытку...
Повторяем попытку...
Доступные форматы для скачивания:
Скачать видео
-
Информация по загрузке:
