Three-Dimensional Optical Wave Field Microscope MINUK
Автор: 大塚電子株式会社
Загружено: 2024-06-11
Просмотров: 219
Описание:
MINUK is capable of evaluating transparent foreign substances and defects in the nano-order, obtaining height direction information in a single shot, and making non-destructive, non-contact and non-invasive measurements.
MINUK also allows the rough position around the target to be scanned at high speed, without focusing, to find the required location.
〉Product information
Three-Dimensional Optical Wave Field Microscope
https://www.otsukael.com/product/deta...
〉Company information
Otsuka Electronics Co., Ltd.
https://www.otsukael.com/
〉Contact
https://www.otsukael.com/inquiry/top
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#Three-Dimensional Optical Wave Field Microscope
#MINUK
#transparent foreign substances
#filler
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