[Materials] In-situ tensile testing of PTFE in SEM
Автор: Hitachi Electron Microscope
Загружено: 2019-11-10
Просмотров: 1233
Описание:
Polytetrafluoroethylene (PTFE) film was pulled apart using tensile substage and the tearing process was observed in situ by ultralow voltage SEM. While landing voltage of 1 kV caused charging, that of 0.3 kV allowed detailed observation without charging even at higher magnification.
Available tools for this measurement are :
FE-SEM
https://www.hitachi-hightech.com/glob...
Further details can be found on our membership website with data library. Looking forward to your joining.
Visit https://biz.hitachi-hightech.com/sina...
About our membership site, see https://www.hitachi-hightech.com/glob...
#electronmicroscope
#electronmicroscopy
#scanningelectronmicroscope
#scanningelectronmicroscopy
Повторяем попытку...
Доступные форматы для скачивания:
Скачать видео
-
Информация по загрузке: