ISO-26262 and Avoiding Hard and Soft errors in Automotive IC, Amir Rahat

Описание: In this lecture, given at ChipEx 2017 in Tel Aviv, Mr. Amir Rahat, VP RnD at Optima Design Automation, discuss the importance of exhaustive-fault-simulation and Functional Safety for Automotive semiconductors and compliance with ISO-26262

Here is the abstract of the talk:

The safety-critical semiconductor products used in the Automotive Industry have to be safe from damages caused by random HW faults, both permanent and transitory, meeting the ISO-26262 standard. We review here the main Design for Safety mechanisms that can be used to ensure design safety, discuss their relative merits, and focus on the validation (e.g., fault simulation) required to ensure the selected mechanisms have been used correctly.