Training session SEM - Pt08
Автор: Magnus Hummelgård
Загружено: 2026-02-13
Просмотров: 10
Описание:
This is the training session SEM Scanning Electron Microscopy. Part 1 contains a general introduction on SEM. The machine used is a Tescan Maia 2016 outfitted with a Oxford EDS 50 detector. This training is part of our program to put our training sessions online and in 14 clips we go through all the operational procedures including EDS sessions.
In between the guided operations you will find lot of extra tips and information on the concepts and underlying technologies.
This part 08 contains:
-column-centering on sample
-stigmatic correction on sample
-insertion and use of the motorized backscatter detector
-simultaneously use of multiple detectors
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