X-Ray Analysis in the SEM: Part 4 "X Ray Detectors"
Автор: Microscopy Australia
Загружено: 2021-03-03
Просмотров: 1981
Описание: Ron Rasch from the Centre for Microscopy & Microanalysis at the University of Queensland, provides an introduction to analysing the elemental composition of samples. Topics include: X-ray production, energy dispersive spectroscopy (EDS), wavelength dispersive spectroscopy (WDS), spectral artefacts and an introduction to matrix correction effects (ZAF). This video is the final video of the series of 4 videos.
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