High-resolution Imaging of Insulating Samples | FIB-SEM & FESEM | ZMCC Live Demo | Episode 10
Автор: ZEISS Microscopy
Загружено: 2024-08-08
Просмотров: 375
Описание:
Join microscopy experts from ZMCC Bay Area as they answer your microscopy questions live.
In this episode you will learn how to be able to:
Learn how to deal with charging artifacts on insulating samples
Quickly and easily achieve charge balance on non-conductive samples without conductive coating
Capture high magnification images without charging artifacts
ℹ️ 𝗠𝗼𝗿𝗲 𝗶𝗻𝗳𝗼𝗿𝗺𝗮𝘁𝗶𝗼𝗻:
🔬 ZEISS Gemini SEM: https://www.zeiss.com/microscopy/en/p...
🔬 ZMCC Bay Area: https://www.zeiss.com/microscopy/us/l...
🔬 ZEISS Portal: http://www.portal.zeiss.com
🔬 More about our microscopy solutions: http://www.zeiss.com/microscopy
💙 𝗦𝗼𝗰𝗶𝗮𝗹𝘀
Instagram: / zeiss_microscopy
Linkedin: / carl-zeiss-microscopy-gmbh
Facebook: / zeissmicroscopy
Повторяем попытку...
Доступные форматы для скачивания:
Скачать видео
-
Информация по загрузке:
