Webinar Recording: Inside the Chip: Semiconductor Failure Analysis with AFM-in-SEM

Описание: Discover how LiteScope AFM-in-SEM technology enhances R&D and failure analysis of semiconductors - harnessing the power of Atomic Force Microscopy integrated directly inside the SEM chamber 🔬

In this webinar, you’ll learn how LiteScope’s correlative workflow (combining SEM, FIB, and AFM) enables true in-situ semiconductor failure analysis. Explore site-specific electrical and topographical characterization of complex structures such as vias, transistors, and doped layers with nanoscale precision. From dopant profiling to conductivity mapping, see real-world examples of how AFM-in-SEM enhances defect localization and reduces turnaround times.

What you'll gain:
✅ Advanced semiconductor failure analysis techniques
✅ How to navigate and analyse interconnects, layered structures, and hidden defects
✅ Benefits of integrated AFM-FIB-SEM for non-destructive, in-vacuum workflows
✅ Practical applications for dopant concentration mapping, I/V characterization, and more

This webinar is perfect for:
🔬 Semiconductor R&D professionals
🔬 Failure analysis engineers
🔬 Scientist doing research in advanced electronics

💬 Have questions?
Contact us: https://www.nenovision.com/contact-us

⚡ Explore more semiconductor use cases:
https://www.nenovision.com/applicatio...

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⏱ Timestamps for easy navigation:
0:00 Nenovision Intro
3:01 AFM-in-SEM Technology
9:01 Failure Analysis & Solution
25:11 Use Case 1: Failure analysis of a NAND structure​
27:20 Use Case 2: Dopant Concentration Analysis of MOSFET Transistor
39:50 Q&A