Transometer™ Demonstration

Описание: The Transometer™ is the first-ever commercially available thermoreflectance-based system to measure the thermal conductivity of thin-films as well as the interface thermal resistance between them. The Transometer’s novel same-side pump and probe approach collects experimental data from a test sample and extracts unknown parameters from matched computational models of equivalent structures. It can even determine the thickness of opaque thin-film layers. Its fully non-contacting and non-destructive technology helps shorten material design cycle time and avoids costly trial and error when dealing with unknown materials or layers of materials.