Atomic Force Microscopy AFM is a high resolution imaging technique that allows for the visualization
Автор: AMO Physics Awards
Загружено: 2023-05-22
Просмотров: 295
Описание:
Atomic Force Microscopy (AFM) is a high-resolution imaging technique that allows for the visualization and characterization of surfaces at the atomic and molecular scale. It is a versatile tool used in various fields, including physics, materials science, biology, and nanotechnology
Probe
Cantilever
Force measurement
Tip-sample interaction
Surface topography
Scanning probe microscopy
Tapping mode
#AFM
#AtomicForceMicroscopy
#Nanoimaging
#Nanotechnology
#SurfaceCharacterization
#Nanoscale
#Cantilever
#ForceSpectroscopy
#nanomechanics
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