Semiconductor Reliability
Автор: ChipCraft
Загружено: 2024-12-26
Просмотров: 1422
Описание:
This presentation is an introduction to many of the reliability issues encountered when designing and manufacturing Integrated Circuits such as ESD, Latchup, Electromigration, antenna diodes, reactive ion etching, hot electrons, impact ionization, NBTI, PBTI, HTOL, HAST, EOS, SETs, and the Purple Plague.
00:00 Intro
01:54 ESD
21:21 Latchup
26:50 Electromigration
34:48 Antenna Diodes
38:37 PBTI & NBTI
42:47 Hot Electrons
49:41 Qualification Testing
51:27 Package Issues
54:51 Conclusions
55:54 Glossary
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