Corning® Tropel® FlatMaster® MSP 300 (Multi-Surface Profiler) Fully Automatic Wafer
Автор: Corning Incorporated
Загружено: 2024-04-08
Просмотров: 1709
Описание: The Corning® Tropel® FlatMaster® MSP 300 (Multi-Surface Profiler) Fully Automatic Wafer is a fully automatic frequency stepping interferometer that provides fast and accurate metrology for semiconductor wafers up to 300mm in diameter. In seconds up to 3 million data points are collected with sub-micron accuracy enabling total thickness and flatness characterization over the entire surface. Take a look at how this analytics instrument provide robust metrology for a variety of applications.
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