PHI Webinar Series: PHI Quantes: XPS/HAXPES Scanning Microprobe
Автор: Physical Electronics
Загружено: 2017-12-08
Просмотров: 2401
Описание:
http://www.phi.com/surface-analysis-e...
Introducing the NEW PHI Quantes: XPS/HAXPES Scanning Microprobe.
The Quantes is a laboratory-based instrument used for performing both traditional XPS measurements using an Al Kα X-ray source, plus extended depth of analysis experiments using a Cr Kα (hard) X-ray source. The latter is referred to as HAXPES – Hard X-ray Photoelectron Spectroscopy.
The Cr X-ray source provides for depths of analysis roughly 3 times those obtained using an Al X-ray source.
The Quantes is based on the tried and true Quantera XPS platform.
To Find out more about the Quantes and all PHI Instruments, please visit our website http://www.phi.com
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