EXFO's EHVA Probe Stations video solutions
Автор: CN Rood
Загружено: 2023-05-16
Просмотров: 86
Описание:
For testing high-performance PIC and optical components, EXFO is now able to offer adaptable turnkey solutions. Next to their measurement solutions for Optical, Electrical and Performance testing, EXFO’s portfolio now includes Probe Stations from EHVA.
EHVA’s wafer level, single and multi-die solutions are available for surface or edge coupling applications. The PILOT software orchestrates all test operations, data collection, management, flow operation, analytics & Business Intelligence.
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