Seminar - Atomic-Resolution Imaging in Scanning Transmission Electron Microscopes
Автор: Characterization at UBC
Загружено: 2026-01-20
Просмотров: 29
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Speaker: Dr. Ismail El Baggari (UBC Department of Physics & Astronomy)
This talk is part of the Characterization @ UBC seminar series, held biweekly in person at UBC.
https://characterization.ubc.ca | / characterization-ubc
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Aberration-corrected scanning transmission electron microscopy (STEM) provides atomic-resolution images of materials and devices, leading to novel insights into their structure, chemistry and bonding. This talk will provide a broad overview on the various imaging and spectroscopy modes within STEM and how they can be used to map various key quantities and phenomena in materials, including dislocations, strain, structural phase transitions, and electronic states. Methods for sample preparation and data analysis will be discussed. Moreover, in situ sample environments now enable imaging under external stimuli (cryogenic cooling, electric biasing, heating), leading to more detailed understanding of the function of materials. Finally, I will review STEM and sample preparation capabilities within UBC.
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