Introduction to Transmission Electron Microscopy (TEM)
Автор: Penn State MRI
Загружено: 2021-12-27
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The Materials Characterization Lab: Introduction to Transmission Electron Microscopy (TEM)
In a transmission electron microscope (TEM), a thin electron beam transparent specimen (ideally ≤ 100 nm) is exposed to a high-energy (typically 60 - 300 keV) electron beam. Images generally contain contrast that may be due to differences in crystallinity, atomic mass, or thickness variations within the sample. Crystallographic information can also be obtained from diffraction patterns.
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