NACK - Characterization - Atomic Force Microscopy

Описание: 2021.02.12 Wesley C. Sanders, Salt Lake Community College

This presentation is part of the NACK - Introduction to Nanotechnology Educators Workshop and can be found at: https://nanohub.org/resources/35473
Information on the NACK Network can be found at: https://www.cneu.psu.edu/ and https://nano4me.org

Table of Contents:
00:00 Atomic Force Microscopy
01:06 The Atomic Force Microscope (AFM)
03:23 AFM Images
05:51 AFM Components
06:40 AFM Operation
07:49 AFM Operation
09:03 AFM Probe
16:13 Contact Mode Damage
16:50 Tapping Mode
19:35 AFM Tip
21:39 AFM Cantilever
22:30 AFM Cantilever
23:41 AFM Cantilever
27:01 Photodiode
30:33 AFM Scanner
34:42 Basic Operating Modes
35:15 Contact Mode
37:03 Contact Mode
38:57 Contact Mode
40:37 Tapping Mode
41:24 Tapping Mode
45:40 Tapping Mode
46:58 Tapping Mode
48:04 Non-Contact
48:25 Non-Contact Mode
49:14 Non-Contact Mode
49:55 Non-Contact Mode
51:45 AFM Applications-Cell Adhesion Studies
56:14 AFM Applications-Mechanical Properties of Viral Particles
58:07 AFM Applications-Mechanical Properties of Viral Particles
60:46 Thank You
61:23 Demo

This presentation and related downloads can be found on nanoHUB.org at: https://nanohub.org/resources/35647