Видео с ютуба Testconx

TestConX 2021 - Jason Mroczkowski: Production Wafer Probe of 77-81 GHz Automotive Radar Applications

TestConX China 2020 Lin Fu: The external and internal changes driving the semiconductor test...

TestConX 2021 - Nozar Naing: Modeling Measurement of High Bandwidth Device

TestConX China 2020 Luca Moriconi: Meeting the Reliability Semiconductor needs of the future in...

TestConX China 2020 Khaled Elmadbouly: RF Simulation Technique for high speed test socket

TestConX China 2020 See Tien "Angie" Ng: Next generation Test Cell/Test Operations

TestConX China 2022 Cham Li: ETS-800 Threshold Test Methods All-In-One”

TestConX 2021 - Jon Semancik: Open Platform Production Test for 5G/mmWave Semiconductor Devices

TestConX China 2022: Challenging solution design and application for automotive electronic...

TestConX China 2020 Doug Malech: High-Speed Serial Testing Goes Beyond Loopback

TestConX 2021 - Jeorge Hurtarte: From 5G mmWave to 6G THz: What's Next in RF Test Challenges

TestConX China 2022 Cleveland Chen: Application of Coaxial Structure on Micro Pitch Sockets

TestConX 2021 - Bert Brost: Evolution of High-Performance Spring Probes

TestConX China 2020 John West: Keynote - Semiconductor Market Update - Making Sense of the Data

TestConX 2021 - Aaren Lonks: Package Testing of mmWave 5G Applications

MultiLane at TestConX China 2020